University of Birmingham > Talks@bham > Physics and Astronomy Colloquia > High Resolution X-ray Scattering and Imaging of Semiconductors: from Science to Spin-out

High Resolution X-ray Scattering and Imaging of Semiconductors: from Science to Spin-out

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Following an overview of the fundamentals of High Resolution X-ray Diffraction, its application to the characterisation of CdTe and Cd1-xZnxTe will be illustrated. Measurements in 1999 revealed that crystals grown by the Multi-Tube Physical Vapour Transport (MTPVT) technique were commercially viable as substrates and X-ray detectors, culminating in the spinning out of Durham Scientific Crystals (renamed Kromek) in 2003. The twists and turns of spin-out company development will be sketched from start-up to AIM floatation in 2013, revealing that commercial success does not always come from the technology initially licensed from a university. Recent High Resolution X-ray Diffraction and X-ray Diffraction Imaging studies at the Diamond Light Source of ZnTe grown by MTPVT at Kromek will be reported, illustrating the role of diffraction studies in continued material development.

The role of X-ray Diffraction Imaging in understanding why and how silicon wafers fracture during high temperature processing will be discussed. The translation of the scientific results, via a European Commission Framework 7 programme with another Durham spin-out company, into a commercial X-ray metrology tool to predict such costly catastrophic failure is also briefly described.

This talk is part of the Physics and Astronomy Colloquia series.

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